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Applied scanning probe methods VI: Characterization

Bhushan, B.

Applied scanning probe methods VI: Characterization by B. Bhushan and S. Kawata - Berlin Springer 2007 - 338p.

ISBN: 3 540 37318 7

Subjects--Topical Terms:
Materials - microscopy
Scanning probe microscopy
Nanotechnology
Particles(Nuclear physics)

Dewey Class. No.: 620.11299 / BHU/A

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