Siegmund, David. <br/><br/>
Sequential analysis  : Tests and confidence intervals 
/ by David Siegmund 
 - New York:   Springer Verlag,   1985. 
 - xi, 272p. 
 - Springer series in statistics .
<br/><br/><label>ISBN: </label>3540961348 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Probability<br/>Random walk<br/>Risk theory<br/>Statistics
<br/><br/><label>Dewey Class. No.: </label>519.2  / SIE/S